Selected Research Projects *

* click title of projects to unfold the details.

  • Breaking the Curse of Dimensionality: A Fast and Provably Bounded Estimation of Rare Events in High Dimensions with Applications to Memory Circuits, UCLA (11/2011-04/2012)
  • Efficient SRAM Failure Rate Prediction by Probability Collectives, UCLA (03/2011-10/2011)
  • Fast Non-Monte-Carlo Transient Noise Analysis for Analog/RF Circuits, UCLA (10/2010-12/2010)
  • Stochastic Analog Circuit Behavior Modeling by Point Estimation Method, UCLA (07/2010- 09/2010)
  • EEG Signal based Brain Control Interface, UCLA (04/2010-05/2011)
  • Global-Search Based Parametric Yield Estimation with Performance Constraints, UCLA (08/2009-12/2009)
  • PiCAP: Parallel and Incremental Capacitance Extraction with Process Variation, UCLA (09/2008-12/2008)
  • 3-D Impedance Extraction Algorithm Based on Mixed Boundary Element Method, Tsinghua University (11/2006-07/2008)

Conference Presentations

  • Oral Presentations
    • ACM International Symposium on Physical Design 2012, Napa Valley, California, March 26, 2012.
    • The Computer-Aided Network Design (CANDE) workshop 2011, San Jose, CA, Nov. 10, 2011.
    • UCLA Electrical Engineering Department Annual Research Review, Los Angeles, CA, Nov. 14, 2011.
      Title: "Rare Event Estimation: Capture the infeasible events in uncertainty", [slides]
    • ACM/IEEE 48th Design Automation Conference, San Diego, CA, June5-10, 2011.
    • ACM International Symposium on Physical Design, Santa Barbara, California, March 27-30, 2011.
    • ACM/IEEE 47th Design Automation Conference, Anaheim, California, June 13 - 18, 2010.
    • ACM/IEEE 46th Design Automation Conference, San Francisco, California, July 26 - 31, 2009.
    • IEEE 13th Asia South Pacific Design Automation Conference, Seoul, Korea, Jan.21~24, 2008.
  • Poster Presentation
    • Design Automation Conference Work-In-Progress Session, San Francisco, CA, June4-7, 2012.
    • SIGDA Ph.D. Forum at Design Automation Conference, San Diego, CA, June5-10, 2011.
      Title:  "Statistical Modeling and Simulation for VLSI Circuits and Systems", [slides]
    • SRC ICSS System Contract Review Conference, Los Angeles, CA, March 7, 2011.
      Title: "Stochastic Modeling and Simulation Using Parallel Computing".
    • UCLA Electrical Engineering Department Annual Research Review, Los Angeles, CA, March 2, 2011.
      Title: "Statistical Modeling and Simulation for VLSI Circuits and Systems".
    • UCLA Electrical Engineering Department Annual Research Review, Los Angeles, CA, Feb 12, 2010.
      Title:"Modeling and Design for Robust Analog Circuits".

Invited Talks

  • “Fast Rare Event Estimation in High Dimension with Application to Memory Circuit”, Mentor Graphic, San Jose, CA, Feb. 2012.
  • "Stochastic Modeling for VLSI circuit and systems", UCLA, Los Angeles, CA, Feb. 2012.
  • “Stochastic Modeling and Validation for Analog/Mixed-Signal Circuits”, Intel Company, San Jose, CA, Feb. 2012.
  • "Efficient Parametric Yield Analysis and Optimization", UCLA, Los Angeles, CA, Jan. 2011.
  • “Stochastic Simulation for Analog Circuit and Stochastic Yield for Memory”, Tsinghua University, Beijing, China, Dec. 2010.
  • "Study on Parametric Yield Analysis for 6-T SRAM Cell", UCLA, Los Angeles, CA, May, 2010.

Professional Services

  • Invited reviewer for journals in the field of VLSI design automation, including
    • IEEE Transactions on Computer-Aided-Design of Integrated Circuits and Systems (TCAD)
    • IEEE Transactions on Very Large Scale Integration Systems (TVLSI)
    • IEEE Transactions on Circuits and Systems (TCAS)
    • IEEE Transactions on Nanotechnology (TNANO)
    • ACM Transactions on Design Automation of Electronic Systems (TODAES)
  • Invited Reviewer for conferences, including
    • IEEE/ACM Design Automation Conference (DAC)
    • IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
    • IEEE/ACM International Symposium on Circuit and System (ISCAS)
    • IEEE/ACM International Symposium on Physical Design (ISPD)
    • IEEE/ACM Asia and South Pacific Design Automation Conference (ASP-DAC).

Media Reports

Software

  • MATLAB solver for rare event estimation [download]
    •  includes Monte Carlo and probability collective based Importance Sampling (IS) method (ISPD'12).
    • uses 6-T SRAM cell as an example to estimate its read failure probability.
    • IS method can provide several orders of magnitude speedup over MC when failure probability is extremely small (e.g., 1e-4~1e-6).

EDA/CAD Selected Conferences